[Asia Economy Reporter Kum Boryeong] Exicon announced on the 15th that it has acquired a patent right related to a 'DUT test system combining a system application board and a square-shaped probe card.'



Exicon stated, "This invention aims to overcome the spatial utilization limitations of probe cards and increase test efficiency," adding, "It will be applied to improve the performance of all our semiconductor inspection equipment and to develop new products."


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